ABIS II – an optical sensor system that is available in different versions and system concepts – allows the fast, reliable and ultra-accurate detection of not only 3D defects on the inspected part (e.g. dents, bumps, sink marks, waviness, constrictions or cracks), but also of contrast-sensitive defects (e.g. scratches, adhesive residues, dust and dirt) using the new contrast sensor upgrade.

Time-consuming and thus expensive rework in subsequent process steps, e.g. at the finish belt, can be efficiently reduced.