ABIS II - System Concepts

ABIS II is a flexible system concept that comes in three different versions. Users can thus choose the sensor system that best meets their application requirements.

ABIS II Offline allows data acquisition and evaluation at an automatic test stand and is excellently suited for accompanying production monitoring. Fault catalogs and classification criteria that have been compiled during the planning stage can be extended and modified. The ABIS II Offline cell can be configured for both mobile use and stationary installation at a fixed position in the press shop. The mobile Offline version features one or more portable platforms, on which the system components are mounted. read more ..

ABIS II - Contrast Sensor

The addition of the new ABIS II contrast sensor system allows quickly and easily extending the range of detectable defects to include surface characteristics that are not visible in the 3D image. With the contrast sensor system, bar-shaped LED lines and the camera are customized for the field of view and the measurement distance of the ABIS II sensor. The images are captured almost simultaneously by the ABIS II sensor and the contrast sensor system (time difference 0.1 msec), so that the overall inspection time for component testing is not prolonged when using the contrast sensor system. read more ..